Bhoir, Mandar S.; Chiarella, Thomas; Mitard, Jerome; Horiguchi, Naoto; Mohapatra, Nihar Ranjan
(Institute of Electrical and Electronics Engineers, 2020-11)
In this work, we have investigated the influence of ${V}_{\text {t}}$ extraction procedure on overall ${V}_{\text {t}}$ variability of sub-10 nm ${W}_{\text {fin}}$ FinFETs. Using six different ${V}_{\text {t}}$ extraction ...