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  • Duhan, Pardeep; Ganeriwala, Mohit D.; Rao, V. Ramgopal; Mohapatra, Nihar Ranjan (IEEE, 2015-08)
    This letter analyzes the width dependence of gate current observed in nMOS transistors fabricated using the 28-nm gate-first CMOS process. It is experimentally shown that the gate current density is ~10× lower for 80-nm ...

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