Duhan, Pardeep; Ramgopal Rao, V.; Mohapatra, Nihar Ranjan
(IEEE, 2016-04-17)
This paper discusses in detail the effects of transistor width and layout on the Hot-Carrier (HC) and Positive Bias Temperature Instability (PBTI) induced degradation in nMOS transistors fabricated using a 28-nm gate-first ...