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Now showing items 1-6 of 6

Random forest based robust classification for lithographic hotspot detection

Dawar, Rohit; Samit Barai; Kumar, Pardeep; Srinivasan, Babji; Mohapatra, Nihar Ranjan (Society of Photo-optical Instrumentation Engineers (SPIE), 2019-04)
A mismatch resilient 16-bit 20 MS/s pipelined ADC

Mohapatra, Satyajit; Gupta, Hari Shanker; Mohapatra, Nihar Ranjan; Mehta, Sanjeev; Roy Chowdhury, Arup; Pandya, Nisha (2019-01)
Capacitance and surface potential model for III-V double-gate FET

Sarath Chandran, G.M.; Ganeriwala, Mohit D.; Mohapatra, Nihar Ranjan (2019-03)
An unified charge centroid model for silicon and low effective mass III-V channel double gate MOS transistors

Gupta, Amratansh; Ganeriwala, Mohit D.; Mohapatra, Nihar Ranjan (2019-01)
Effect of sub-10nm fin-widths on the analog performance of FinFETs

Bhoir, Mandar S.; Mohapatra, Nihar Ranjan; Chiarella, Thomas; Ragnarsson, Lars �ke; Mitard, Jerome; Terzeiva, Valentina; Horiguchi, Naoto (2019-03-12)
Design and calibration of 14-bit 10 KS/s low power SAR ADC for Bio-medical applications

Mekkattillam, Yadukrishnan; Mohapatra, Satyajit; Mohapatra, Nihar Ranjan (2019-07-04)