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Showing 10 out of a total of 31 results for community: Materials Science and Engineering.
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Experimental investigation into the micro edm characteristics of conductive sic
Saxena, Krishna Kumar
;
Suman Srivastava, Anand
;
Agarwal, Sanjay
(
Elsevier
,
2016-01
)
Mechanical activation of gibbsite and boehmite: new findings and their implications
Mehrotra, S. P.
;
Alex, T. C.
;
Greifzu, G.
;
Kumar, Rakesh
(
Springer India
,
2016-01
)
Stability of ultra-thin oxide overgrowths on binary Al–Si alloy substrate
Ajmera, Darshan
;
Panda, Emila
(
Springer US
,
2016-05
)
Formability characterization of aluminum lithium alloys used in spacecraft industry
Saxena, Krishna Kumar
;
Mukhopadhyay, Jyoti
;
Ramesh, K. V.
(
2016-11-11
)
Labelling nanoparticles with non-radioactive isotopes
Misra, Superb K.
;
Valsami-Jones, Eugenia
;
Dybowska, Agnieszka
(
Taylor & Francis
,
2016
)
Elevated temperature forming limit strain diagrams of automotive alloys Al6014-T4 and DP600: a case study
Saxena, Krishna Kumar
;
Drotleff, Klaus
;
Mukhopadhyay, Jyoti
(
SAGE Publications
,
2016-08
)
Microstructure and micro-texture evolution during large strain deformation of aluminium alloy AA 2219
Sarkar, Aditya
;
Murty, S.V.S. Narayana
;
Narayanan, P. Ramesh
;
Venkitakrishnan, P. V.
;
Mukhopadhyay, Jyoti
(
Elsevier
,
2016-11
)
Variation of electrical properties in thickening Al-doped ZnO films: Role of defect chemistry
Singh, Chetan C.
;
Panda, Emila
(
Royal Society of Chemistry
,
2016-01
)
Interpreting the conductive atomic force microscopy measured inhomogeneous nanoscale surface electrical properties of Al-doped ZnO films
Patel, Tvarit
;
Panda, Emila
(
Wiley
,
2016-12
)
A note on the Caccioppoli inequality for Biharmonic operators
Dwivedi, Gaurav
;
Tyagi, Jagmohan
(
Springer Verlag
,
2016-08
)
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Author
Panda, Emila (9)
Arora, Amit (6)
Mukhopadhyay, Jyoti (4)
Saxena, Krishna Kumar (4)
Ajmera, Darshan (3)
Majhi, Sasmita (3)
Mishra, Abhijit (3)
Sahlot, Pankaj (3)
Bandaru, Narendra (2)
Das, Ipsita Madhumita (2)
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Formability (2)
AA 2219 (1)
Al-doped ZnO (1)
Aluminum (1)
Bayer process (1)
Bending limit curve (1)
Boehmite (1)
C-AFM tip (1)
Caccioppoli inequality (1)
Ceramic (1)
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2016 (31)