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Showing 10 out of a total of 19 results for collection: Journal Articles. (0.023 seconds)

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Role of Interface(s) for the Growth of Ultra-Thin Amorphous Oxides on Al–Si Alloys: A Thermodynamic Analysis

Panda, Emila; Manwani, Krishna (Wiley, 2014-02)
Epitaxial ferroelectric Pb(Mg1/3Nb2/3)O3-PbTiO3 thin films on La0.7Sr0.3MnO3 bottom electrode

Chopra, A.; Panda, Emila; Kim, Y.; Arredondo, M.; Hesse, D. (Springer, 2014-06)
Thermodynamics of interface formation between Hexa-Peri Hexabenzocoronene and Cupric oxide

Manwani, Krishna; Panda, Emila (Elsevier, 2015-02)
Relation between surface and bulk electronic properties of Al doped ZnO films deposited at varying substrate temperature by radio frequency magnetron sputtering

Singh, Chetan C.; Patel, Tvarit; Panda, Emila (AIP Publishing, 2015-06)
Stability of ultra-thin oxide overgrowths on binary Al–Si alloy substrate

Ajmera, Darshan; Panda, Emila (Springer US, 2016-05)
Microstructural analysis of multi-phase ultra-thin oxide Overgrowth on Al–Mg Alloy by high resolution transmission electron microscopy

Bandaru, Narendra; Ajmera, Darshan; Manwani, Krishna; Majhi, Sasmita; Panda, Emila (Springer, 2017-07)
Variation of electrical properties in thickening Al-doped ZnO films: Role of defect chemistry

Singh, Chetan C.; Panda, Emila (Royal Society of Chemistry, 2016-01)
Interpreting the conductive atomic force microscopy measured inhomogeneous nanoscale surface electrical properties of Al-doped ZnO films

Patel, Tvarit; Panda, Emila (Wiley, 2016-12)
Oxidation of TbFe2: Microstructure of oxide-film by both theory and experiment

Manwani, Krishna; Chelvane, Arout J.; Panda, Emila (Elsevier, 2018-01)
Microstructure influenced variation in the local surface electrical heterogeneity in thickening Al-doped ZnO films: evidence using both scanning tunnelling spectroscope and conductive atomic force microscope

Patel, Tvarit A.; Singh, Chetan C.; Panda, Emila (Elsevier, 2018-03)

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