Patel, TvaritTvaritPatelPanda, EmilaEmilaPanda2025-09-042025-09-042016-12-12http://repository.iitgn.ac.in/handle/IITG2025/31108en-USRole of tip geometry in Conductive Atomic Force Microscopy for investigating nanoscale surface electrical properties of Al-doped ZnO filmsConference Paper123456789/573