Maheshwari, NavinNavinMaheshwariPatel, KrishKrishPatelAgarwal, KshitijKshitijAgarwalAli, HasanHasanAliKumar, RiteshRiteshKumarLashkare, SandipSandipLashkare2026-03-132026-03-132025-12-1310.1109/ICEE67165.2025.11409772https://repository.iitgn.ac.in/handle/IITG2025/34819en-USESD protectionLow voltageAsymmetric diodePunch-throughImpact ionizationCapacitance reductionNIPIN diode with designable asymmetry for low voltage and low capacitance system level ESD protectionConference Paper