Mekie, JoyceeBarma, AbhishekAbhishekBarma2025-09-042025-09-042019-01-01https://repository.iitgn.ac.in/handle/IITG2025/32172ill.; 30 cm.en-US17210024Electrical EngineeringRobust CircuitsParticle Strike ImmunityDual Port-Dual Interlocked StructureMixed Vt Ternary Content Addressable MemoryHigh performance rediation hardened random access and content addressable memory designsM.Tech Thesesxi, 75p.123456789/500