Insights into the threshold voltage variability in back-gated WSe2 FETs: a multi-scale device modeling approach

Sinha, SohamSohamSinhaTewari, MohitMohitTewariAgarwal, TarunTarunAgarwal2026-03-132026-03-132025-12-1310.1109/ICEE67165.2025.11409927https://repository.iitgn.ac.in/handle/IITG2025/34828en-USInsights into the threshold voltage variability in back-gated WSe2 FETs: a multi-scale device modeling approachConference Paper