Radiation hardened memory cell design and verification of memory macros at RTL level

Mekie, JoyceeAgarwal, TusharTusharAgarwal2025-09-042026-03-282025-09-042021-01-01https://repository.iitgn.ac.in/handle/IITG2025/32282ill.; hbk.; 30 cm.en-US19210111Electrical EngineeringDICE CellProgressionsDNU PrincipleEletrostatisitcsMicro TransistorsChipsRadiation hardened memory cell design and verification of memory macros at RTL levelM.Tech Thesesxiv, 130p.123456789/500