Mohapatra, Nihar RanjanKiran, Chakka Yaswanth SaiChakka Yaswanth SaiKiran2025-09-042025-09-042018-01-01https://repository.iitgn.ac.in/handle/IITG2025/32141ill.; 29 cm.en-USSemiconductor Devices16210028High TemperatureSaturation VelocityTwo-dimensional Electron GasFabricated DeviceSemiconductor DevicesSimulation and analysis of contact resistance in AIGaN/GaN HEMT devicesM.Tech Thesesviii, 51p.123456789/500