Guarded dual rail logic for soft error tolerant standard cell library

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dc.contributor.author Kaur, Raminder
dc.contributor.author Surana, Neelam
dc.contributor.author Mekie, Joycee
dc.contributor.other IEEE International conference on Radiation effects on Electronic Components and Systems (RADECS 2016)
dc.coverage.spatial Bremen, DE
dc.date.accessioned 2017-05-09T07:02:19Z
dc.date.available 2017-05-09T07:02:19Z
dc.date.issued 2016-09-19
dc.identifier.citation Kaur, Raminder; Surana, Neelam and Mekie, Joycee, "Guarded dual rail logic for soft error tolerant standard cell library", in IEEE International conference on Radiation effects on Electronic Components and Systems (RADECS 2016), Bremen, DE, Sep. 19-23, 2016. en_US
dc.identifier.uri https://repository.iitgn.ac.in/handle/123456789/2916
dc.identifier.uri http://www.radecs2016.com/joomla/
dc.description.statementofresponsibility by Raminder Kaur, Neelam Surana and Joycee Mekie
dc.language.iso en_US en_US
dc.title Guarded dual rail logic for soft error tolerant standard cell library en_US
dc.type Presentation en_US


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