Kaushal, Neeraj Kumari; Dan, Virender; Mohapatra, Nihar Ranjan
(Institute of Electrical and Electronics Engineers (IEEE), 2022-06)
In this work, a scalable robust substrate current model for laterally diffused MOS (LDMOS) transistors is presented. The model is created in two stages. First, a model for intrinsic drain voltage, which accurately captures ...