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  • Kaushal, Neeraj Kumari; Dan, Virender; Mohapatra, Nihar Ranjan (Institute of Electrical and Electronics Engineers (IEEE), 2022-06)
    In this work, a scalable robust substrate current model for laterally diffused MOS (LDMOS) transistors is presented. The model is created in two stages. First, a model for intrinsic drain voltage, which accurately captures ...

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