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Compact modeling of gate capacitance in III-V channel quadruple-gate FETs

Yadav, Chandan; Ganeriwala, Mohit D.; Mohapatra, Nihar Ranjan; Agarwal, Amit; Chauhan, Yogesh Singh (IEEE, 2017-07)

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Author
- Agarwal, Amit (1)
- Chauhan, Yogesh Singh (1)
- Ganeriwala, Mohit D. (1)
- Mohapatra, Nihar Ranjan (1)
- Yadav, Chandan (1)
Subject
- Data models (1)
- Field effect transistors (1)
- Integrated circuit modeling (1)
- Logic gates (1)
- Numerical models (1)
- Quantum capacitance (1)
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Date Issued
- 2017 (1)