Nidhin, K.; Balanethiram, Suresh; Nair, Deleep R.; D'Esposito, Rosario; Mohapatra, Nihar Ranjan; Fregonese, Sebastien; Zimmer, Thomas; Chakravorty, Anjan
(Institute of Electrical and Electronics Engineers, 2022-12)
A prior estimate of the impact of thermal resistance from the back-end-of-line (BEOL) metallization layers is crucial for an accurate circuit design and thermally aware device design. This article presents a robust technique ...