Duhan, Pardeep; Rao, V. Ramgopal; Mohapatra, Nihar Ranjan
(Institute of Electrical and Electronics Engineers, 2020-07)
The hot carrier (HC) induced degradation has become a major concern in advanced CMOS technologies because of non-scalable VDD. In this work, we have shown that the HC induced degradation in gate-first HKMG nMOS transistors ...