Author

Author

Sort by: Order: Results:

  • Jolad, Shivakumar; Roman, Ahmed; Shastry, Mahesh C.; Basu, Ayanendranath (arXiv, Cornell University Library, 2014-09)
    Divergence measures are widely used in various applications of pattern recognition, signal processing and statistical applications. In this paper, we introduce a new one parameter family of divergence measures, called ...

Search Digital Repository


Browse

My Account