A 1531.52 nm tunable diode laser-based system for high-sensitivity remote monitoring of acetylene and ammonia leaks in industrial plants

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dc.contributor.author Roy, Anirban
dc.contributor.author Chakraborty, Arup Lal
dc.contributor.author Grattan, Kenneth T. V.
dc.contributor.other International Conference on Optics and Electro-Optics (ICOL 2019)
dc.coverage.spatial Dehradun, IN
dc.date.accessioned 2021-03-16T12:19:00Z
dc.date.available 2021-03-16T12:19:00Z
dc.date.issued 19-10-19
dc.identifier.citation Roy, Anirban; Chakraborty, Arup Lal and Grattan, Kenneth T. V., "A 1531.52 nm tunable diode laser-based system for high-sensitivity remote monitoring of acetylene and ammonia leaks in industrial plants", in the Proceedings of the International Conference on Optics and Electro-Optics (ICOL 2019):, Dehradun, IN, Oct. 19-22, 2019. en_US
dc.identifier.uri https://repository.iitgn.ac.in/handle/123456789/6365
dc.description.statementofresponsibility by Anirban Roy, Arup LalChakraborty and Kenneth T. V. Grattan
dc.language.iso en_US en_US
dc.title A 1531.52 nm tunable diode laser-based system for high-sensitivity remote monitoring of acetylene and ammonia leaks in industrial plants en_US
dc.type Article en_US


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