Anjaneyulu, Guguloth; Panigrahy, Asisa Kumar; Kumar, Mukku Pavan; Haq, Shams Ul; Darabi, Abdolreza; Abbasian, Erfan; Sharma, Priyanka; Prakash, M. Durga
(Institute of Electrical and Electronics Engineers (IEEE), 2025)
Various charged particles in space threaten memory circuit integrity and dependability, including photons, alpha particles, and high-energy ions outside the Low Earth Orbit region. These particles particularly affect ...