Fast measurement of group index variation with optimum precision using Hong-Ou-Mandel interferometry

Abstract

Hong–Ou–Mandel (HOM) interferometry has emerged as a valuable means for quantum sensing applications, particularly in measuring physical parameters that influence the relative optical delay between photon pairs. Unlike classical techniques, HOM-based quantum sensors offer higher resolution due to the intrinsic dispersion cancellation property of correlated photon pairs. Due to the use of single photons, HOM-based quantum sensors typically involve a large integration time to acquire the signal and subsequent post-processing for high-resolution measurements, restricting their use for real-time operations. Based on our understanding of the relationship between measurement resolution and the gain medium length that produces photon pairs, we report here on the development of an HOM-based quantum sensor for high-precision group index measurements. Using a 1 mm long periodically poled KTP (PPKTP) crystal for photon-pair generation, we have measured the group index with a precision of ~ 6.75 X 10-6 per centimeter of sample length at an integration time of 100 ms, surpassing the previous reports by 400%. Typically, the measurement range reduces with the increase in the resolution. However, using a novel scheme compensating photon delay due to group index changes stepwise with an optical delay stage, we have measured the group index variation of PPKTP crystal over a range of 3.5 × 10−3 for a temperature change from 25 to 200 °C, corresponding to an optical delay adjustment of ∼200 μm while maintaining the same precision (⁠~ 6.75 X 10-6 per centimeter of sample length). The current results establish the usefulness of HOM-interferometer-based quantum sensors for fast, precise, and long-range measurements in various applications, including quantum optical coherence tomography.