dc.contributor.advisor |
Mohapatra, Nihar Ranjan |
|
dc.contributor.author |
Kaur, Ramandeep |
|
dc.date.accessioned |
2025-09-11T15:52:55Z |
|
dc.date.available |
2025-09-11T15:52:55Z |
|
dc.date.issued |
2025 |
|
dc.identifier.citation |
Kaur, Ramandeep. (2025). Nanosheet FET based CMOS technology for future electronics: challenges in sheet thickness scaling and solutions. Gandhinagar: Indian Institute of Technology Gandhinagar, 117p. (Acc. No.: T01309) |
|
dc.identifier.uri |
https://repository.iitgn.ac.in/handle/123456789/12006 |
|
dc.description.statementofresponsibility |
by Ramandeep Kaur |
|
dc.format.extent |
xxvi, 117p.: hbk.: 30 cm |
|
dc.language.iso |
en_US |
|
dc.publisher |
Indian Institute of Technology Gandhinagar |
|
dc.subject |
18310035 |
|
dc.subject |
Ph.D |
|
dc.subject |
Electrical Engineering |
|
dc.subject |
CMOS Technology |
|
dc.subject |
Computational Framework |
|
dc.subject |
TCAD Calibration |
|
dc.subject |
Sheet Thickness Scaling |
|
dc.subject |
Strain Engineering |
|
dc.subject |
Design Space Exploration |
|
dc.title |
Nanosheet FET based CMOS technology for future electronics: challenges in sheet thickness scaling and solutions |
|
dc.type |
Thesis |
|
dc.contributor.department |
Electrical Engineering |
|
dc.description.degree |
Ph.D. |
|