Synthesis, electrical transport mechanisms and photovoltaic characteristics of p-ZnIn2Se4/n-CdTe thin film heterojunction

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dc.contributor.author Dhruv, D. K.
dc.contributor.author Patel, B. H.
dc.contributor.author Agrawal, Naveen
dc.contributor.author Banerjee, Rupak
dc.contributor.author Dhruv, S. D.
dc.contributor.author Patel, P. B.
dc.contributor.author Patel, Vikas,
dc.coverage.spatial United Kingdom
dc.date.accessioned 2022-08-22T04:58:23Z
dc.date.available 2022-08-22T04:58:23Z
dc.date.issued 2022-08
dc.identifier.citation Dhruv, D. K.; Patel, B. H.; Agrawal, Naveen; Banerjee, Rupak; Dhruv, S. D.; Patel, P. B. and Patel, Vikas, "Synthesis, electrical transport mechanisms and photovoltaic characteristics of p-ZnIn2Se4/n-CdTe thin film heterojunction", Journal of Materials Science: Materials in Electronics, DOI: 10.1007/s10854-022-08755-z, Aug. 2022. en_US
dc.identifier.issn 0957-4522
dc.identifier.issn 1573-482X
dc.identifier.uri https://doi.org/10.1007/s10854-022-08755-z
dc.identifier.uri https://repository.iitgn.ac.in/handle/123456789/7974
dc.description.abstract The synthesis and electrical transport features of vacuum-deposited p-ZnIn2Se4/n-CdTe (p-ZIS/n-CT) heterojunction diode (HJD) are discussed. Transmission electron microscopy (TEM) was used to characterize the microstructures of p-ZIS and n-CT thin films. The Hall measurement system determined the conductivity and carrier concentration of the ZIS and CT films; the acceptor concentration (Na) for ZIS film and donor concentration (Nd) for CT film observed are 4.12×1013cm−3 and 2.80×1014cm−3, respectively. The DC electrical resistance (R) variation with temperature (T) determines thermal activation (impurity-based conduction) and bandgap energies of p-ZIS and n-CT thin films. Scanning electron microscopy (SEM) was used to look at the surface morphology of p-ZIS/n-CT HJD. The semiconductor characterization system (SCS-4200) was used to characterize the current–voltage (I−V) and capacitance–voltage (C–V) of the p-ZIS/n-CT HJD at different T (303−340K). The p-ZIS/n-CT HJD’s dark I−V finding shows conventional diode nature with a decent rectification ratio (RR) (≃4.34×105at±2.0V). At a given bias, the RR value drops as T increases. The systematic assessment of I−V data suggests the thermionic emission (TE) mechanism at lower bias and the space charge-limited conduction (SCLC) mechanism at higher bias. The quantitative analysis estimates the barrier height (φb) as ≃0.79eV (from I−V measurements) and ≃0.88eV (from C–V measurements). Cheung’s function was utilized to derive the φb, ideality factor (n) and the series resistance (Rs) of the p-ZIS/n-CT HJD. With a rise in T, HJD’s saturation current (Is), n and φb rise, whilst, Rs falls. To gain insight into depletion behaviour, a study examined space charge and electric field distributions for abrupt p-ZIS/n-CT HJD. The experimental findings of Anderson’s model corroborate a theoretical energy band diagram for the p-ZIS/n-CT HJD. The p-ZIS/n-CT HJD’s photovoltaic (PV) characterization resulted in a 0.51 fill factor and 1.04% efficiency. The implications are discussed.
dc.description.statementofresponsibility by D. K. Dhruv, B. H. Patel, Naveen Agrawal, Rupak Banerjee, S. D. Dhruv, P. B. Patel and Vikas Patel
dc.language.iso en_US en_US
dc.publisher Springer en_US
dc.subject Thermal activation en_US
dc.subject Heterojunction diode en_US
dc.subject Impurity-based conduction en_US
dc.subject Transmission electron microscopy en_US
dc.subject Microstructures en_US
dc.title Synthesis, electrical transport mechanisms and photovoltaic characteristics of p-ZnIn2Se4/n-CdTe thin film heterojunction en_US
dc.type Article en_US
dc.relation.journal Journal of Materials Science: Materials in Electronics


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