Nanosheet FET based CMOS technology for future electronics: challenges in sheet thickness scaling and solutions
Source
Indian Institute of Technology, Gandhinagar
Date Issued
2025-01-01
Author(s)
Kaur, Ramandeep
Subjects
18310035
Ph.D
Electrical Engineering
CMOS Technology
Computational Framework
TCAD Calibration
Sheet Thickness Scaling
Strain Engineering
Design Space Exploration