Repository logo
  • English
  • العربية
  • বাংলা
  • Català
  • Čeština
  • Deutsch
  • Ελληνικά
  • Español
  • Suomi
  • Français
  • Gàidhlig
  • हिंदी
  • Magyar
  • Italiano
  • Қазақ
  • Latviešu
  • Nederlands
  • Polski
  • Português
  • Português do Brasil
  • Srpski (lat)
  • Српски
  • Svenska
  • Türkçe
  • Yкраї́нська
  • Tiếng Việt
Log In
New user? Click here to register.Have you forgotten your password?
  1. Home
  2. IIT Gandhinagar
  3. Electrical Engineering
  4. EE Publications
  5. Process voltage temperature variability estimation of tunneling current for band-to-band-tunneling based neuron
 
  • Details

Process voltage temperature variability estimation of tunneling current for band-to-band-tunneling based neuron

Source
arXiv
Date Issued
2023-06-01
Author(s)
Patil, Shubham
Sharma, Anand
R., Gaurav
Kadam, Abhishek
Singh, Ajay Kumar
Lashkare, Sandip
Mohapatra, Nihar Ranjan
Ganguly, Udayan
DOI
10.48550/arXiv.2306.11640
Abstract
Compact and energy-efficient Synapse and Neurons are essential to realize the full potential of neuromorphic computing. In addition, a low variability is indeed needed for neurons in Deep neural networks for higher accuracy. Further, process (P), voltage (V), and temperature (T) variation (PVT) are essential considerations for low-power circuits as performance impact and compensation complexities are added costs. Recently, band-to-band tunneling (BTBT) neuron has been demonstrated to operate successfully in a network to enable a Liquid State Machine. A comparison of the PVT with competing modes of operation (e.g., BTBT vs. sub-threshold and above threshold) of the same transistor is a critical factor in assessing performance. In this work, we demonstrate the PVT variation impact in the BTBT regime and benchmark the operation against the subthreshold slope (SS) and ON-regime (ION) of partially depleted-Silicon on Insulator MOSFET. It is shown that the On-state regime offers the lowest variability but dissipates higher power. Hence, not usable for low-power sources. Among the BTBT and SS regimes, which can enable the low-power neuron, the BTBT regime has shown ~3x variability reduction ({\sigma}_I_D/{\mu}_I_D) than the SS regime, considering the cumulative PVT variability. The improvement is due to the well-known weaker P, V, and T dependence of BTBT vs. SS. We show that the BTBT variation is uncorrelated with mutually correlated SS & ION operation - indicating its different origin from the mechanism and location perspectives. Hence, the BTBT regime is promising for low-current, low-power, and low device-to-device variability neuron operation.
URI
http://repository.iitgn.ac.in/handle/IITG2025/19965
Subjects
BTBT
MOSFET
PVT variability
SS
ION
IITGN Knowledge Repository Developed and Managed by Library

Built with DSpace-CRIS software - Extension maintained and optimized by 4Science

  • Privacy policy
  • End User Agreement
  • Send Feedback
Repository logo COAR Notify