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  4. Analog performance of gate-first HKMG NMOS transistors - Role of device dimensions and layout
 
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Analog performance of gate-first HKMG NMOS transistors - Role of device dimensions and layout

Source
International Symposium on VLSI Technology Systems and Applications Proceedings
ISSN
19308868
Date Issued
2015-06-03
Author(s)
Mohapatra, Nihar R.  
Naresh, Satya Siva
Duhan, Pardeep
DOI
10.1109/VLSI-TSA.2015.7117576
Volume
2015-June
Abstract
In this paper, we analyze the role of device dimensions and layout/design rules on the analog performance of HKMG NMOS transistors. We have shown ∼28% improvement in the intrinsic gain and ∼26% improvement in the g<inf>m</inf>/I<inf>d</inf> for an 80nm wide transistor compared to a 1μm wide one. We have also shown that the analog performance of transistors could be improved further by dividing a single active into multiple active fingers, by increasing the active to active spacing and by eliminating the active dummies.
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URI
https://d8.irins.org/handle/IITG2025/21450
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