Grazing incidence X-ray scattering techniques to study growth mechanism of organic films

dc.contributor.author	Banerjee, Rupak
dc.contributor.author	Kowarik, Stefan
dc.contributor.author	Schreiber, Frank
dc.coverage.spatial	Singapore
dc.date.accessioned	2021-06-05T09:32:50Z
dc.date.available	2021-06-05T09:32:50Z
dc.date.issued	2021-04
dc.identifier.citation	Banerjee, Rupak; Kowarik, Stefan and Schreiber, Frank, "Grazing incidence X-ray scattering techniques to study growth mechanism of organic films", in Advanced characterization of nanostructured materials: probing the structure and dynamics with synchrotron X-rays and neutrons, DOI: 10.1142/9789811231513_0002, Singapore: World Scientific, pp. 49-95, Apr. 2021, ISBN: 9789811231506	en_US
dc.identifier.isbn	9.79E+12
dc.identifier.uri	http://dx.doi.org/10.1142/9789811231513_0002
dc.identifier.uri	https://repository.iitgn.ac.in/handle/123456789/6539
dc.description.statementofresponsibility	by Rupak Banerjee, Stefan Kowarik and Frank Schreiber
dc.format.extent	pp. 49-95
dc.language.iso	en_US	en_US
dc.publisher	World Scientific	en_US
dc.title	Grazing incidence X-ray scattering techniques to study growth mechanism of organic films	en_US
dc.type	Book Chapter	en_US

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