Deep unsupervised despeckling with unbiased risk estimation

Source
IEEE International Conference on Image Processing (ICIP 2025)
Date Issued
14-09-2025
Author(s)
Gupta, Ashutosh
Seelamantula, Chandra Sekhar
Blu, Thierry
Dube, Nitant
DOI
Unpaywall
URI
Subjects
Despeckling
SAR
Multiplicative noise
Deep learning
MURE