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  5. Deep unsupervised despeckling with unbiased risk estimation
 
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Deep unsupervised despeckling with unbiased risk estimation

Source
IEEE International Conference on Image Processing (ICIP 2025)
Date Issued
14-09-2025
Author(s)
Gupta, Ashutosh
Seelamantula, Chandra Sekhar
Blu, Thierry
Dube, Nitant
Raman, Shanmuganathan  
DOI
10.1109/ICIP55913.2025.11084619
Unpaywall
URI
http://repository.iitgn.ac.in0/handle/IITG2025/33145
Subjects
Despeckling
SAR
Multiplicative noise
Deep learning
MURE
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