Fundamental limits on neural network density by memory parameters and rram variability with temperature

Source
Indian Institute of Technology, Gandhinagar
Date Issued
2025-01-01
Author(s)
Solanki, Nirmal
URI
Subjects
23210064
M. Tech
Electrical Engineering
IMC Architectures
Memory Parameters
RRAM
Crossbar Array Variability
Memory Window
Sensitivity Margin