| dc.contributor.author |
Patel, Tvarit |
|
| dc.contributor.author |
Singh, Chetan C. |
|
| dc.contributor.author |
Panda, Emila |
|
| dc.contributor.other |
European Materials Research Society Fall meeting 2014 |
|
| dc.coverage.spatial |
Warsaw, PL. |
|
| dc.date.accessioned |
2015-01-18T11:18:43Z |
|
| dc.date.available |
2015-01-18T11:18:43Z |
|
| dc.date.issued |
2014-09-15 |
|
| dc.identifier.citation |
Patel, Tvarit; Singh,Chetan and Panda, Emila, “Study of nanoscale local conductance of Al doped ZnO thin films with varying substrate temperature using Conducting probe atomic force microscopy”, in European Materials Research Society Fall meeting 2014, Warsaw, PL, Sep. 15-19, 2014. |
en_US |
| dc.identifier.uri |
https://repository.iitgn.ac.in/handle/123456789/1572 |
|
| dc.description.statementofresponsibility |
by Tvarit Patel, Chetan Singh and Emila Panda |
|
| dc.language.iso |
en_US |
en_US |
| dc.publisher |
European Materials Research Society |
en_US |
| dc.subject |
Atomic Force Microscopy |
en_US |
| dc.subject |
Conducting probe |
en_US |
| dc.subject |
Nanoscale |
en_US |
| dc.title |
Study of nanoscale local conductance of Al doped ZnO thin films with varying substrate temperature using Conducting probe atomic force microscopy |
en_US |
| dc.type |
Article |
en_US |