| dc.contributor.author |
Patel, Tvarit |
|
| dc.contributor.author |
Panda, Emila |
|
| dc.contributor.other |
International Conference on Functional Materials (ICFM - 2016) |
|
| dc.coverage.spatial |
Indian Institute of Technology Kharagpur, IN |
|
| dc.date.accessioned |
2016-12-28T05:49:29Z |
|
| dc.date.available |
2016-12-28T05:49:29Z |
|
| dc.date.issued |
2016-12-12 |
|
| dc.identifier.citation |
Patel, Tvarit and Panda, Emila, "Role of tip geometry in Conductive Atomic Force Microscopy for investigating nanoscale surface electrical properties of Al-doped ZnO films", in the International Conference on Functional Materials (ICFM - 2016), Indian Institute of Technology Kharagpur, IN, Dec. 12-14, 2016. |
en_US |
| dc.identifier.uri |
https://repository.iitgn.ac.in/handle/123456789/2592 |
|
| dc.description.statementofresponsibility |
by Tvarit Patel and Emila Panda |
|
| dc.language.iso |
en_US |
en_US |
| dc.title |
Role of tip geometry in Conductive Atomic Force Microscopy for investigating nanoscale surface electrical properties of Al-doped ZnO films |
en_US |
| dc.type |
Article |
en_US |